Cleveland Crystals, Inc. II-VI Crystals

II-VI Crystals
CdS, CdTe, ZnS, ZnSe, ZnTe
(Data apply to high-resistivity, nearly intrinsic material at room temperature unless otherwise noted)

Click HERE FIRST for help with your frequency conversion application.

Items below marked with an asterisk * are shown for reference only and are not currently available from CCI.

	CdS	CdSe	CdTe*	ZnS(Hex)^(a)*	ZnS(Cub)*	ZnSe*	ZnTe*
Micron range of >50% transmission (2mm xtal)	0.53 - 15⁽⁴¹⁾	0.8 - 18	1 - 28	---	0.4 - 14	0.5 - 19	0.6⁽⁹⁾ - 25
Absorption coeff. @10.6µm (cm^-1)	0.01	0.001	0.0014⁽¹³⁾	---	---	0.005	0.008
Index of refraction^(b)
0.50µm	---	---	---	---	2.4208⁽⁵⁾	2.750⁽⁵²⁾	---
0.55µm n_o n_e	2.580 2.593⁽⁴⁶⁾	---	---	---	---	2.655⁽⁶⁾ 2.670⁽⁵²⁾	---
0.589µm n_o n_e	2.509 2.525⁽²⁾	---	---	2.356 2.378⁽⁴⁾	2.369⁽⁴⁾	2.625⁽⁵²⁾	3.054⁽⁹⁾
0.633µm n_o n_e	2.465 2.483⁽⁴⁶⁾	---	---	---	2.3523⁽⁵⁾	2.592⁽⁵²⁾	2.984⁽⁹⁾
0.70µm n_o n_e	2.414 2.432⁽⁴⁶⁾	---	---	---	2.333⁽⁵⁾	---	2.913⁽⁹⁾
0.80µm n_o n_e	2.377 2.394⁽⁴⁶⁾	2.6448 2.6607⁽⁵⁾	---	---	2.3146⁽⁵⁾	---	2.853⁽⁹⁾
1.00µm n_o n_e	2.336 2.354⁽⁴⁶⁾	2.5502 2.5696⁽⁵⁾	2.84⁽³⁾	---	2.2932⁽⁵⁾	2.48⁽³⁾	2.790⁽⁹⁾
1.40µm n_o n_e	2.304 2.321⁽⁴⁶⁾	2.4929 2.5133⁽⁵⁾	---	---	2.2762⁽⁵⁾	---	2.741⁽⁹⁾
3.39µm n_o n_e	2.2747 2.2907⁽²⁾	2.4562 2.4754^(2)(d)	---	---	---	---	---
10.6µm n_o n_e	2.226 2.239⁽²⁾	2.430 2.448^(2)(d)	2.6708⁽⁵⁰⁾	---	---	2.392⁽⁷⁾ 2.407⁽⁵¹⁾	2.70⁽⁸⁾
1/n dn/dT RT(10^-5/°C)
0.69µm	10.11	---	---	---	---	---	---
1µm o-ray e-ray	---	12 12	---	---	---	2.655⁽⁶⁾ 2.670⁽⁵²⁾	---
10.6µm o-ray e-ray	6.0 6.2⁽⁴⁸⁾	---	9.8⁽⁴⁹⁾	---	4.6⁽⁴⁹⁾	5.2⁽⁴⁹⁾	---
Electro-Optic Constants
r₄₁^T(pm/V) Halfwave Voltage(kV) Wavelength(µm)	---	---	4.5⁽¹⁰⁾ 5 1.0	---	-1.5 9.4 0.436	1.9⁽⁵⁴⁾ 9.45 0.633	4.51⁽⁹⁾ 2.3 0.589
r₄₁^T(pm/V) Halfwave Voltage(kV) Wavelength(µm)	---	---	6.8⁽⁸⁾ 42 10.6	---	-2.1 10.7 0.589	1.9⁽⁵⁴⁾ 200 10.6	3.9⁽¹⁰⁾ 69 10.6
r₄₁^S(pm/V) Wavelength(µm)	---	---	---	---	1.6 0.633	2.0⁽⁸⁾ 0.633	4.3⁽⁸⁾ 0.633
r₄₁^S(pm/V) Wavelength(µm)	---	---	---	---	1.4 3.39	---	---
r₅₁^T(pm/V) Wavelength(µm)	1.6⁽⁴⁴⁾ 0.633	---	---	---	---	---	---
r₁₃^T(pm/V) Wavelength(µm)	3.1⁽⁴⁴⁾ 1.15	---	---	---	---	---	---
r₁₃^S(pm/V) Wavelength(µm)	1.1⁽⁴³⁾ 0.633	1.8⁽⁴³⁾ 3.39	---	0.92^(43.45) 0.633	---	---	---
r₃₃^T(pm/V) Wavelength(µm)	3.2⁽⁴⁴⁾ 1.15	1.6⁽⁵³⁾ 0.8	---	---	---	---	---
r₃₃^S(pm/V) Wavelength(µm)	2.4⁽⁴³⁾ 0.633	4.3⁽⁴³⁾ 3.39	---	-1.85^(43.45) 0.633	---	---	---
r_c^T(pm/V) Wavelength(µm)	4.8⁽⁴⁴⁾ 0.633	---	---	---	---	---	---
r_c^T(pm/V) Wavelength(µm)	5.5⁽⁴³⁾ 10.6	---	---	---	---	---	---
NLO Susceptibility (pm/V) ^(8,54)
d₁₄ @28µm	---	---	60	---	---	---	---
d₁₄ @10.6µm ^(f)	---	---	---	---	30	80	90
d₃₃ @10.6µm ^(f)	44 ±13	44 ±13	55 ±13	37 ±13	---	---	---
d₃₁ @10.6µm ^(f)	-26 ±6	-29 +/6	---	-19 ±6	---	---	---
d₁₅ @10.6µm ^(f)	29 ±7	31 ±8	---	21 ±8	---	---	---
d₁₄ @1.06µm	---	---	---	---	25	103	108
d₃₃ @1.06µm	100	---	---	44	---	---	---
d₃₁ @1.06µm	-16 ±1	---	---	-9 ±2	---	---	---
d₁₅ @1.06µm	17 ±1	---	---	8 ±1	---	---	---
Piezo-Optic Constants(pm²/N)
q₁₁ @10.6µm	---	---	-5.91 ±0.21⁽¹⁴⁾	---	---	---	---
q₁₂ @10.6µm	---	---	2.22 ±0.08⁽¹⁴⁾	---	---	---	---
q₄₄	---	---	-2.85 ±0.33⁽¹⁴⁾ (10.6µm)	---	-1.70 @0.6µm⁽⁵⁵⁾	-1.45 @0.63µm⁽⁵⁵⁾	-1.62 @0.7µm⁽⁵⁵⁾
Pulsed Damage Threshold (MW/cm²)	---	60⁽²⁾	---	---	---	---	---
Structure type⁽¹⁶⁾	Heaxagonal Wurtzite	Heaxagonal Wurtzite	Cubic Sphalerite	Heaxagonal Wurtzite	Cubic Sphalerite	Cubic Sphalerite	Cubic Sphalerite
Space Group⁽¹⁶⁾	P6mc	P6mc	F3m	P6mc^(a)	F3m	F3m	F3m
Wurtzite Parameter u (ideal=0.375)⁽¹⁷⁾	0.378	0.377	---	0.374	---	---	---
Lattice Constants Å, 25°C	Ref (18)	Ref (18)		Ref (19)	Ref (20)
a_o c_o	4.1367 ±0.0003 6.7161 ±0.0005	4.2972 ±0.0003 7.0064 ±0.0005	6.4830 ±0.0004 ------ ------	3.8218 ±0.0004 6.25875 ±0.0001	5.4094 ±0.0002 ------ ------	5.6687 ±0.0003 ------ ------	6.1034 ±0.0003 ------ ------
Calc'd Density g/cc, 25°C	4.819	5.670	5.849	4.087	4.088	5.262	5.636
Cleavage	---	---	[110]	[110] [100]	[110]	[110]	[110]
Thermal Expansion (10^-6/°C) Perp. to c Along c Temp range°C	---	---	4.5⁽²¹⁾ --- 50	6.5⁽²²⁾ 4.6⁽²²⁾ 25	5.9 --- 25-100	7.1⁽⁷⁾ --- 29	8.36 --- 25-100
Thermal Conductivity (W/cm/°C), 25°C	---	---	0.06	---	---	0.19⁽⁵⁶⁾	--
Heat Capacity (J/mole/°C)	---	---	54⁽⁴⁰⁾	---	47⁽²⁴⁾	51⁽⁴⁰⁾	51
Melting Point,°C	1397 ±2⁽¹⁸⁾	1258 ±2⁽¹⁸⁾	1097 ±2	1718 ±10⁽²⁵⁾	---	1526 ±10⁽²⁵⁾	1292 ±5
Flexural Strength (psi)	~4000	~3000	~3000	~10000	---	~8500	~3500
Estimated max. safe operating temp,°C	---	---	>200	>200	>200	>200	>200
Dark resistivity (ohm-cm)
Typical As-Grown	~2000	~2000	~1000	---	10⁸	10⁸	~10
Max. (compensated)	>10⁹	>10⁹	>10⁷	---	10⁹-10¹⁰⁽¹¹⁾	10⁸-10⁹⁽²³⁾	10⁸-10⁹
Minimum	<10^-2	<10^-2	<10^-2	---	---	<10^-1	<10
Type	n	n	p or n	p	p	n	p
Hall Mobilties (cm²/V-sec) (highest measured)
300°K	350(e)	650(e)	1000(e)	---	100(e)	400(e)	130(h)
80°K	5200(e)	5000(e)	10000(e)	---	---	5000(e)	2600(h)
Energy Gap(eV)300°K	2.42⁽²⁸⁾	1.72⁽²⁹⁾	1.44⁽³⁹⁾	---	---	2.7	2.23⁽³²⁾
dE_G/dT (eV/°K)	-5E-4⁽²⁷⁾	-4E-4⁽³⁰⁾	---	3.6	---	---	-5.5E-4⁽³²⁾
Effective carrier mass
Electrons	0.205m_e⁽³³⁾	0.130m_e	0.11m_e	0.27m_e	---	0.17m_e	---
Holes	2.1m_e⁽³³⁾	0.7m_e	0.63m_e	---	---	---	0.6m_e
Sound velocities,25°C(m/s)
Longitudinal Waves
propagation along c particle motion along c	4470	3860	---	---	---	---	---
propagation perp. to c particle motion perp. to c	4340	3610	3020	---	5060	4040	3560
Transverse Waves
propagation along c particle motion perp. to c	1770	1520	1850	---	3360	2780	2350
propagation perp. to c particle motion along to c	1800	1530	---	---	---	---	---
propagation perp. to c particle motion perp. to c	1700	1590	---	---	---	---	---
Relative dielectric constant 25°C⁽³⁴⁾
₃₃^T/_o	10.33	10.65	---	8.00⁽⁴¹⁾	---	---	---
₁₁^T/_o	9.35	9.70	11.0⁽³⁹⁾	8.58⁽⁴¹⁾	8.37	9.25⁽³⁹⁾	10.10
₃₃^T/_o	9.53	10.20	---	---	---	---	---
₁₁^T/_o	9.02	9.53	---	---	8.32	9.12	10.10
Piezoelectric Coefficients,25°C
d₃₁ (pC/N)	-5.18	-3.92	---	-1.1⁽¹²⁾	---	---	---
d₃₃ (pC/N)	10.32	7.87	---	3.2⁽¹²⁾	---	---	---
d₁₅ (pC/N)	-13.98	-10.51	---	-2.8⁽¹²⁾	---	---	---
d₁₄ (pC/N)	---	---	1.54	---	3.18	1.10	0.91
d_h (pC/N)	0.0	0.0	---	1.1⁽¹²⁾	---	---	---
e₃₁ (C/m²)	-0.244	-0.160	---	0.10⁽²⁶⁾	---	---	---
e₃₃ (C/m²)	0.440	0.347	---	0.35⁽²⁶⁾	---	---	---
e₁₅ (C/m²)	-0.210	-0.138	---	-0.08⁽²⁶⁾	---	---	---
e₁₄ (C/m²)	---	---	~0.304	---	0.147	0.049	0.0284
Piezoelectric Coupling Factors⁽³⁴⁾
k₃₃	0.262	0.194	---	0.127⁽¹²⁾	---	---	---
k₃₁	0.1191	0.0836	---	0.039⁽¹²⁾	---	---	---
k₁₅	0.1885	0.1305	---	0.052⁽¹²⁾	---	---	---
k_t	0.154	0.124	---	---	---	---	---
k₁₄	---	---	~0.023	---	0.0795	0.026	0.017
Elastic Constants⁽³⁴⁾ (10^-11m²/N)
s₁₁^E	2.069	2.338	---	---	1.839	2.26	2.40
s₃₃^E	1.697	1.735	---	---	---	---	---
s₁₂^E	-0.999	-1.122	---	---	-0.707	-0.85	-0.873
s₁₃^E	-0.581	-0.572	---	---	---	---	---
s₄₄^E	6.649	7.595	---	---	2.168	2.27	3.21
s₆₆	6.136	6.920	---	~3.12?⁽³⁵⁾	---	---	---
s₁₁^D	2.040	2.322	---	~1.10?⁽³⁵⁾	---	---	---
s₃₃^D	1.581	1.670	---	~0.85?⁽³⁵⁾	---	---	---
s₁₂^D	-1.028	-1.138	---	~ -0.46⁽³⁵⁾	---	---	---
s₁₃^D	-0.523	-0.539	---	~ -0.21⁽³⁵⁾	---	---	---
s₄₄^D	6.412	7.466	---	~3.51⁽³⁵⁾	2.154	2.27	3.21
c₁₁^E	9.07	7.41	5.351⁽³⁶⁾	---	10.46	8.59⁽³⁷⁾	7.13
c₃₃^E	9.38	8.36	---	---	---	---	---
c₁₂^E	5.81	4.52	3.681⁽³⁶⁾	---	6.53	5.06(37)	4.07
c₁₃^E	5.10	3.93	---	---	---	---	---
c₄₄^E	1.504	1.317	1.994⁽³⁶⁾	---	4.613	4.06⁽³⁷⁾	3.12
c₆₆	1.630	1.445	---	~3.2⁽³⁵⁾	---	---	---
c₁₁^D	9.13	7.42	---	~12.4⁽³⁵⁾	---	8.59⁽³⁷⁾	---
c₃₃^D	9.623	8.477	---	~14.0⁽³⁵⁾	---	---	---
c₁₂^D	5.888	4.53	---	~6.0⁽³⁵⁾	---	5.06⁽³⁷⁾	---
c₁₃^D	4.97	3.86	---	~4.5⁽³⁵⁾	---	---	---
c₄₄^D	1.560	1.340	---	~2.85⁽⁷⁾	4.643	4.06⁽³⁷⁾	3.12

We have attempted to be as accurate as possible in gathering data and noting sources, but no guarantees can be made. In general, non-referenced data was internally generated, but it is possible that errors may appear. Apologies are offered to anyone whose data are miscredited. Any suggestions for corrections or additions will be considered for the next revision.

Mixed crystals are available in the systems CdS-CdSe, with properties intermediate between the end members. Inquiries are welcomed. Other mixed crystals are occasionally available, but are more difficult to grow due to lattice and volatility mismatch.

FOOTNOTES

(a) Much of the data in the literature on the "hexagonal" form of ZnS is on polytypes that vary only slightly in bulk properties from the cubic form, although such is frequently not disclosed. We have attempted to evaluate the data on the internal evidence to eliminate those which obviously do not apply to pure wurtzite. The attempt may not have been completely successful. Examples of information on polytypes may be found in reference 12, and refernce 8. The data on the cubic form of ZnS are usually on material which is free of polytypes.

(b) Refernces 15 and 50 give formulae for calculating indicies of refraction vs. wavelength for CdSe and CdTe. Cleveland Crystals has determined single resonance dispersion curve-fits to existing data for ZnS and ZnSe and ZnTe. Contact us for more information.

(d) Indicies of refraction of uncompensated crystals tend to be lower.

(e) See refernence 49.

(f) These values are taken from two refernces (8 and 54), so may not be completely self-consistent.

REFERENCES

 1) R.L. Herbst and R.L. Beyer, Appl. Phys. Lett. 19,
527-30(1971)

 2) R.L. Beyer, private comminucation.

 3) D.T.F. Marple, J. Appl. Phys. 35, 539-42(1964)

 4) C. Palache, H. Berman, and C Frondel, Dana's System of
Minerology 7th ed, Vol 1. p211,217 John Wiley and Sons, New York(1944)

 5) W.L. Bond, J. Appl. Phys., 36 1674-7(1965)

 6) R.W. McQuald, Proc. IEEE 50, 2484-5(1962);51, 470(1963);
K. Tada and M. Aoki, Japan J. Appl. Phys., 10, 998-1001(1971)

 7) J.R. Jurdock, Summary Report No. AFML TR-74-166, Part 1,
Perkin Elmer Corp.(Oct 1974)

 8) R.J. Pressley, Ed. Handbook of Lasers, Ch 15 by I.P.
Kaminow and  E.H. Turner, p447-59 and Ch 18 by S. Singh, p 489-525, Chemical
Rubber Publishing Co., Cleveland, Ohio(1971)

 9) T.R. Sliker and J.M. Jost, J. Opt. Soc. Am. 56,
130-1(1966)

10) K. Tada and M. Aoki, Japan J. Appl. Phys., 10, 998-1001(1971)

11) S. Namba, J. Opt. Soc. Am. 51, 76-9(1961)

12) I.B. Kobyakov, Sov. Phys.-Cryst. 11, 369-71(1966)

13) A.W. Tucker, M. Birnbaum, H. Mentes, and C.L. Fincher, Appl.
Opt. 21, 2920-2(1982)

14) R. Well and M.J. Sun, Proc. Int. Symp. CdTe, Mater. Gamma Ray
Detectors 1971, XIX 1-6(1972)

15) G.C. Bahr, D.C. Hanna, B. Luther-Davies  and R.C. Smith,
Optics Commun. 6, 323-6(1972)

16) J.D.H. Donnay, et al.,Editors, Crystal Data, 2nd ed, ACA
Monograph No. 5, Washington DC(April 1, 1963).

17) G.A. Jeffery, G.S. Perry, and R.L. Mozzi, J. Chem. Phys. 25,
1024-31(1956)

18) W.R. Cook Jr., J. Am. Ceram. Soc. 51, 518-20(1968)

19) W.R. Cook Jr., Norelco Reporter 10 (4), 144-5(1963)

20) B.J. Skinner and P.B. Barton Jr., Am. Mineral. 45,
612-25(1960)

21) W.L. Wolfe, Ed., Handbook of Military Infrared Technology,
Superintendent of Documents, U.S. Gov't. Printing Office, Washington DC 20402


22) R.R. Reeber and G.W. Powell, J. Appl. Phys. 38, 1531-4(1967)

23) G.A. Zholkevich, Soviet Phys.- Solid State 2, 1009(1960)

24) A.J. Moses, Optical Materials Properties, IFI/Plenum, New
York(1971)

25) L.A. Sysoev, et al., Izv. Akad. Nauk SSSR 3, 390-1(1967)

26) V.A. Zhdanov and L.A. Brysneva, Sov. Phys. - Cryst. 19,
223-5(1974)

27) C.C. Klick, Phys. Rev. 98, 272(1953)

28) M. Balkaivski and R.D. Waldron, Phys. Rev. 112, 123(1958)

29) R.G. Wheeler and J.D. Dimmmock, Phys. Rev. 125, 1805(1962)

30) R.H. Bube, Phys. Rev. 98, 431(1955)

31) J.T. Milek, "Electro-optic Properties and Modulator
Applications of Cadmium Telluride", Interim Report No. 75(Revised), Air Force
Materials Laboratory (Jan. 1971)

32) J.H. Haanstra and C. Haas, Phys. Lett. 2, 21(1961)

33) J.J. Hopfield and D.G. Thomas, Phys. Rev. 112, 35-52(1961)

34) D. Berlincourt, H. Jaffe, and L.R. Shiozawa, Phys. Rev. 129,
1009-17(1963)    (The value of 9.33 e₁₁^S/e_o in the paper was a
misprint)

35) V.G. Zubov, L.A. Sysoev, and M.M. Firsova, Soviet Phys.
-Cryst. 12, 67-70(1967)

36) H.J. McSkimin and D.G. Thomas, J. Appl. Phys. 33,
56 (1962)

37) B.H. Lee, J. Appl. Phys. 41, 2988-90(1970)

38) H.P. Singh and B. Dayal, Phys. Staus Solidi 23, K93-5(1967)

39) I. Strzalkowski, S. Joshi, and C.R. Crowell, Appl. Phys.
Lett. 28, 350-2(1976)

40) J.C. Wurst, Univ. of Dayton, Dayton, Ohio, Quarterly
Prohgress Report No. 1 (UDR1-QPR-71-10), Contract F33615-72-C-1257, Wright-Patterson Air Force Base, Ohio.

41) S.J. Czyzak, H. Payne, W.M. Baker, J.C. Manthuruthil, and
T.M. Bieniewski, Univ. Detroit Tech. Rept. No. 6, ONR Contract Nonr
1511 (01), Project No. 015-218 (Sept 1, 1960)

42) O.G. Lorimor and W.G. Spitzer, J. Appl. Phys. 36,
0841-4(1965)

43) I.P. Kaminow and E.H. Turner, Appl. Opt. 5, 1612-28(1960);
Proc. IEEE 54, 1374-90(1966)

44) M. Sugre and K. Tada, Japan J. Appl. Phys. 15, 421-30(1976)

45) R.C. Miller, S.C. Abrahams, R.L. Barnes, J.L. Bernstein, W.A.
Nordland, and E.H. Turner, Solid State Commun. 9, 1463-5(1971)

46) T.M. Bleniewski and S.J. Czyzak, J. Opt. Soc. Am. 53,
496-7(1963)

47) M.P. Lisitsa, L.F. Gudymenko, et al., Phys Status Solidi 31,
389-99(1969)

48) R. Well and D. Neshmit, J. Opt Soc. Am. 67, 190-5(1977)

49) R.J. Harris, G.T. Johnson, G.A. Kepple, P.C. Kroc, and H.
Mukai, Appl. Opt. 16, 436-8(1977)

50) A.G. DeBell, E.L. Dereniak, J. Harvey, J. Nissley, J. Palmer,
A. Selvarajan, and W.L. Wolfe, Appl. Opt. 18, 3114-5(1979)

51) C.J.C. Thompson, A.G. DeBell and W.L. Wolfe, Appl. Opt. 18,
2085-6(1979)

52) J.A. Wunderlich and L.G. DeShazer, Appl. Opt. 16,
1584-7(1977)

53) D.A. Belogurov and Yu.S. Vishnyakov, Opt. Spectrosc. 46,
112-3(1979)

54) Landolt-Bornstein, New Series, Vol III-11, Springer-Verlag,
Berlin(1979)

55) Landolt-Bornstein, New Series, Vol III-18, Springer-Verlag,
Berlin(1984)

56) Photonics Spectra, Nov. 1995, page 101.