Thin Film
Coatings
Cleveland Crystals provides thin-film
coatings
tailored to the specific needs of its customers and optimized for
the characteristics
of each type of substrate. Dielectric, metallic, Sol- Gel,
Hybrid,
and Moisture Barrier films provide a wide range of properties to
enhance
the performance of both linear and nonlinear optics.
-
Single and multi-layer dielectric
anti-reflection
(AR) coatings are available for deep UV to FIR
applications.
Prototype Mid-IR partial and high reflectors, with low water
absorption
characteristics, are also available.
-
Sol-Gel style AR coatings
(based on the
deposition of colloidal silica) provide the ultimate in laser
damage resistance.
-
Hybrid AR coatings are
dielectric/Sol-Gel
combinations tailored to optimize BBO optical parametric
oscillator (OPO)
performance.
-
Moisture Barrier films are
designed to offer
protection for moisture sensitive crystal or glass
surfaces. Each
of these coating systems can be used to improve the performance
of individual
components or an entire optical system
Coating
Diagnostics
Cleveland Crystals has a wide range
of diagnostics
to analyze the performance of these coatings. Basic
transmission
and reflectivity measurements from ~185 to 3200nm are performed
on Perkin-Elmer  -9
and -900 spectrophotometers.
Custom fixturing allows accurate measurement of high index
materials in
transmission. Polarized measurements can be made from ~300
to 2700nm.
A Pye-Unicam spectrophotometer is used for transmission
measurements from
2.5 to 50 um.
To provide quantitative measurements of film absorption,
Cleveland Crystals
has designed and built four laser calorimetry test stations to
provide
data at 0.244, 0.514, 0.633, 1.064, 2.79, 2.94 and 10.6um.
This information
is invaluable for the QA/QC of production films, especially in
the IR,
and for the evaluation of new films for use where coating
absorption may
be an issue. This capability is only commercially available
at Cleveland
Crystals. Laser damage testing can be performed in the
nanosecond
regime at 0.266, 0.355, 0.532 and 1.064um. Similar
testing
can be done in the microsecond (~80ns pulses are planned for
later this)
regime at 2.79 and 2.94 um.
|
